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	<title><![CDATA[shamir Resources | ZDNet]]></title>
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		<title><![CDATA[Chip bugs can lead to major security disasters]]></title>
		<link><![CDATA[http://talkback.zdnet.com/5208-10532-0.html?forumID=1&threadID=41145&messageID=761345&start=0]]></link>
		<description><![CDATA[Chip bugs can lead to major security disastersChip bugsShamir suggests that it's impractical to test all cases of 64*64-bit multiplication. But given the lifespan of a chip design, and given that the test only needs to be run once, wouldn't it be practical to design a "grid" or "distributed" test,...]]></description>
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		<pubDate>Mon, 19 Nov 2007 07:42:00 -0800</pubDate>
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